top of page
Scanning Electron Microscope
WJMG has a Scanning Electron Microscope (SEM) available for detailed images of any metallic surfaces. With magnification capabilities up to 100,000X and a large stage allowing for an array of samples. This allow for irregular surfaces from fracture samples to be closely examine. Equipped with multiple detectors such as energy dispersive X-ray (EDX) silicon drift, and backscatter.
WJMG has a Keyence digital microscope for capturing detailed images. Magnification ranging from 20X up to 1,000X and also equipped with automated X Y stage for large and small sample analysis. Having the capability to use 3D image for determining and examining depth of cracks or corrosion on any surface.
bottom of page